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Tailoring switching and endurance / retention reliability characteristics of HfO2 / Hf RRAM with Ti, Al, Si dopants
Publication:
Tailoring switching and endurance / retention reliability characteristics of HfO2 / Hf RRAM with Ti, Al, Si dopants
Date
2014
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Yangyin
;
Roelofs, Robin
;
Redolfi, Augusto
;
Degraeve, Robin
;
Crotti, Davide
;
Fantini, Andrea
;
Clima, Sergiu
;
Govoreanu, Bogdan
;
Komura, Masanori
;
Goux, Ludovic
;
Zhang, Leqi
;
Belmonte, Attilio
;
Xie, Qi
;
Maes, Jan
;
Pourtois, Geoffrey
;
Jurczak, Gosia
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2075
since deposited on 2021-10-22
Acq. date: 2025-10-28
Citations
Metrics
Views
2075
since deposited on 2021-10-22
Acq. date: 2025-10-28
Citations