Publication:

Tailoring switching and endurance / retention reliability characteristics of HfO2 / Hf RRAM with Ti, Al, Si dopants

Date

2014

Proceedings Paper

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Files

29098.pdf 1.22 MB

Author(s)

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Redolfi, Augusto

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Degraeve, Robin

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Fantini, Andrea

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Govoreanu, Bogdan

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Komura, Masanori

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Belmonte, Attilio

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Pourtois, Geoffrey

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Acq. date: 2025-12-16