Publication:
Extraction of the top and sidewall mobility in FinFETs and the impact of fin-patterning processes and gate dielectrics on mobility
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1922 since deposited on 2021-10-16
3last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1922 since deposited on 2021-10-16
3last month
Acq. date: 2025-12-08
Citations