Publication:
Stochastic variability of vacancy filament configuration in ultra-thin dielectric RRAM and its impact on OFF-state reliability
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1867 since deposited on 2021-10-21
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Acq. date: 2026-08-07
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1867 since deposited on 2021-10-21
3last month
3last week
Acq. date: 2026-08-07
Citations