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Impact of partial resistive defects and bias temperature instability on SRAM decoder reliability
Publication:
Impact of partial resistive defects and bias temperature instability on SRAM decoder reliability
Date
2013
Proceedings Paper
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27047.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Khan, Seyab
;
Taouil, Mottaqiallah
;
Hamdioui, Said
;
Kukner, Halil
;
Raghavan, Praveen
;
Catthoor, Francky
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1855
since deposited on 2021-10-21
Acq. date: 2025-10-29
Citations
Metrics
Views
1855
since deposited on 2021-10-21
Acq. date: 2025-10-29
Citations