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Copper through silicon vias studied by the photo-elastic Scanning Infrared Microscope SIREX
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Copper through silicon vias studied by the photo-elastic Scanning Infrared Microscope SIREX
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Herms, Martin
;
Wagner, M.
;
De Wolf, Ingrid
Journal
Microelectronics Reliability
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Views
1889
since deposited on 2021-10-23
1
last month
1
last week
Acq. date: 2026-01-26
Citations