Publication:
Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1920 since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1920 since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations