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Electrical activity of intragrain defects in polycrystalline silicon layers obtained by aluminium-induced crystallization and epitaxy
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Electrical activity of intragrain defects in polycrystalline silicon layers obtained by aluminium-induced crystallization and epitaxy
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Date
2007-02
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Gestel, Dries
;
Romero, M.J.
;
Gordon, Ivan
;
Carnel, Lodewijk
;
D'Haen, Jan
;
Beaucarne, Guy
;
Al-Jassim, M.
;
Poortmans, Jef
Journal
Applied Physics Letters
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1845
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Acq. date: 2025-12-10
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Views
1845
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-10
Citations