Publication:

Device assessment of electrically active defects in high-mobility materials

Date

2016
Journal article
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dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.contributor.authorEneman, Geert
dc.contributor.authorNi, Kai
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorLoo, Roger
dc.contributor.authorGupta, Somya
dc.contributor.authorMerckling, Clement
dc.contributor.authorAlian, AliReza
dc.contributor.authorCaymax, Matty
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.date.accessioned2021-10-23T10:20:16Z
dc.date.available2021-10-23T10:20:16Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.issn2162-8769
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26461
dc.identifier.urlhttp://jss.ecsdl.org/content/5/4/P3149.abstract
dc.source.beginpageP3149
dc.source.endpage3165
dc.source.issue4
dc.source.journalECS Journal of Solid State Science and Technology
dc.source.volume5
dc.title

Device assessment of electrically active defects in high-mobility materials

dc.typeJournal article
dspace.entity.typePublication
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