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Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopy

Date

1998
Journal article
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dc.contributor.authorBijnens, W.
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorManca, Jean
dc.contributor.authorD'Haen, Jan
dc.contributor.authorWu, Ting-Di
dc.contributor.authorD'Olieslaeger, Marc
dc.contributor.authorBeyne, Eric
dc.contributor.authorKiebooms, R.
dc.contributor.authorVanderzande, Dirk
dc.contributor.authorGelan, J.
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorDe Schepper, Luc
dc.contributor.authorStals, Lambert
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorD'Haen, Jan
dc.contributor.imecauthorD'Olieslaeger, Marc
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorVanderzande, Dirk
dc.contributor.imecauthorDe Ceuninck, Ward
dc.date.accessioned2021-09-30T11:28:38Z
dc.date.available2021-09-30T11:28:38Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2400
dc.source.beginpage87
dc.source.endpage96
dc.source.issue2
dc.source.journalSynthetic Metals
dc.source.volume96
dc.title

Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopy

dc.typeJournal article
dspace.entity.typePublication
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