Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
A dedicated loading instrument for characterization and testing of MEMS
Publication:
A dedicated loading instrument for characterization and testing of MEMS
Date
2005-10
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kalicinski, Stanislaw
;
Sabuncuoglu Tezcan, Deniz
;
De Moor, Piet
;
De Vries, Atze-Cees
;
Van Hoof, Chris
;
Wevers, Martine
;
De Wolf, Ingrid
Journal
Abstract
Description
Metrics
Views
1956
since deposited on 2021-10-16
Acq. date: 2025-10-26
Citations
Metrics
Views
1956
since deposited on 2021-10-16
Acq. date: 2025-10-26
Citations