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Leveraging power spectral density for scalable system-level accuracy evaluation

Date

2016
Proceedings Paper
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dc.contributor.authorParashar, Karthick
dc.contributor.authorBarrois, Benjamin Barrois
dc.contributor.authorSentieys, Olivier Sentieys
dc.date.accessioned2021-10-23T13:34:01Z
dc.date.available2021-10-23T13:34:01Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27122
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7459407/
dc.source.beginpage750
dc.source.conferenceDesign, Automation and Test in Europe Conference and Exhibition - DATE
dc.source.conferencedate14/03/2016
dc.source.conferencelocationDresden Germany
dc.source.endpage755
dc.title

Leveraging power spectral density for scalable system-level accuracy evaluation

dc.typeProceedings paper
dspace.entity.typePublication
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