Publication:

Impact of CMOS processing steps on the drain current kink of NMOSFETS at liquid helium temperature

Date

Loading...
Thumbnail Image

Journal

Abstract

Description

Metrics

Views

1963 since deposited on 2021-10-14
3last month
Acq. date: 2026-01-10

Citations

Metrics

Views

1963 since deposited on 2021-10-14
3last month
Acq. date: 2026-01-10

Citations