Publication:

EduQG: A Multi-Format Multiple-Choice Dataset for the Educational Domain

Date

2023
Journal article
https://doi.org/10.1109/ACCESS.2023.3248790
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dc.contributor.authorHadifar, Amir
dc.contributor.authorKiros Bitew, Semere
dc.contributor.authorDeleu, Johannes
dc.contributor.authorDevelder, Chris
dc.contributor.authorDemeester, Thomas
dc.contributor.imecauthorHadifar, Amir
dc.contributor.imecauthorKiros Bitew, Semere
dc.contributor.imecauthorDeleu, Johannes
dc.contributor.imecauthorDevelder, Chris
dc.contributor.imecauthorDemeester, Thomas
dc.contributor.orcidimecHadifar, Amir::0000-0003-4934-2928
dc.contributor.orcidimecDeleu, Johannes::0000-0001-8277-2415
dc.contributor.orcidimecDevelder, Chris::0000-0003-2707-4176
dc.contributor.orcidimecDemeester, Thomas::0000-0002-9901-5768
dc.contributor.orcidimecKiros Bitew, Semere::0000-0002-4001-6803
dc.date.accessioned2023-07-18T13:25:41Z
dc.date.available2023-03-27T03:48:54Z
dc.date.available2023-07-18T13:25:41Z
dc.date.embargo2023-02-24
dc.date.issued2023
dc.description.wosFundingTextThis work was supported in part by the Flanders Innovation and Entrepreneurship (VLAIO), Flanders, Belgium, through the imecicon Project "AI-Driven e-Assessment"(AIDA); and in part by the Flemish Government through the "Onderzoeksprogramma Artificiele Intelligentie (AI) Vlaanderen"Program.
dc.identifier.doi10.1109/ACCESS.2023.3248790
dc.identifier.issn2169-3536
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41388
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage20885
dc.source.endpage20896
dc.source.issue/
dc.source.journalIEEE ACCESS
dc.source.numberofpages12
dc.source.volume11
dc.subject.keywordsQUESTION
dc.subject.keywordsTESTS
dc.title

EduQG: A Multi-Format Multiple-Choice Dataset for the Educational Domain

dc.typeJournal article
dspace.entity.typePublication
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