Assymetry of the RTSs capture and emission kinetics in nMOSFETs processed in a 0.35μm CMOS technology

dc.contributor.author	Lukyanchikova, N. B.
dc.contributor.author	Petrichuk, M. V.
dc.contributor.author	Garbar, N. P.
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-09-30T09:17:23Z
dc.date.available	2021-09-30T09:17:23Z
dc.date.embargo	9999-12-31
dc.date.issued	1997
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/2003
dc.source.beginpage	232
dc.source.conference	Noise in Physical Systems and 1/f Fluctuations: Proceedings of the 14th International Conference
dc.source.conferencedate	14/07/1997
dc.source.conferencelocation	Leuven Belgium
dc.source.endpage	235
dc.title	Assymetry of the RTSs capture and emission kinetics in nMOSFETs processed in a 0.35μm CMOS technology
dc.type	Proceedings paper
dspace.entity.type	Publication
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