Publication:
ON-State Human Body Model ESD Failure Mechanisms in GaN-on-Si RF MIS-HEMTs
| dc.contributor.author | Wu, Wei-Min | |
| dc.contributor.author | Chen, Shih-Hung | |
| dc.contributor.author | Shih, Chun-An | |
| dc.contributor.author | Parvais, Bertrand | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.author | Ker, Ming-Dou | |
| dc.contributor.author | Wu, Tian-Li | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Wu, Wei-Min | |
| dc.contributor.imecauthor | Chen, Shih-Hung | |
| dc.contributor.imecauthor | Parvais, Bertrand | |
| dc.contributor.imecauthor | Collaert, Nadine | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Chen, Shih-Hung::0000-0002-6481-2951 | |
| dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
| dc.contributor.orcidimec | Wu, Wei-Min::0000-0002-8390-6785 | |
| dc.date.accessioned | 2024-02-27T09:10:12Z | |
| dc.date.available | 2023-08-26T17:25:39Z | |
| dc.date.available | 2024-02-27T09:10:12Z | |
| dc.date.issued | 2023 | |
| dc.description.wosFundingText | This work was supported by the imec High-Speed Analog/RF Program, Belgium.& nbsp; | |
| dc.identifier.doi | 10.1109/LED.2023.3290034 | |
| dc.identifier.issn | 0741-3106 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42401 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 1248 | |
| dc.source.endpage | 1251 | |
| dc.source.issue | 8 | |
| dc.source.journal | IEEE ELECTRON DEVICE LETTERS | |
| dc.source.numberofpages | 4 | |
| dc.source.volume | 44 | |
| dc.title | ON-State Human Body Model ESD Failure Mechanisms in GaN-on-Si RF MIS-HEMTs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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