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Scattered Emission Profile Technique for Accurate and Fast Assessment of Optical Gain in Thin Film Lasing Materials
Publication:
Scattered Emission Profile Technique for Accurate and Fast Assessment of Optical Gain in Thin Film Lasing Materials
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Date
2023-05-05
Journal article
https://doi.org/10.1021/acsphotonics.3c00204
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Annavarapu, Nirav
;
Goldberg, Iakov
;
Papadopoulou, Athina
;
Elkhouly, Karim
;
Genoe, Jan
;
Gehlhaar, Robert
;
Heremans, Paul
Journal
ACS PHOTONICS
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183
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Acq. date: 2026-01-05
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1166
since deposited on 2023-05-25
Acq. date: 2026-01-05
Citations
Metrics
Downloads
183
since deposited on 2023-05-25
6
last month
Acq. date: 2026-01-05
Views
1166
since deposited on 2023-05-25
Acq. date: 2026-01-05
Citations