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A spectroscopic ellipsometry study of ultra thin amorphous silicon layers deposited on crystalline silicon by PECVD
Publication:
A spectroscopic ellipsometry study of ultra thin amorphous silicon layers deposited on crystalline silicon by PECVD
Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Abdulraheem, Yaser
;
Gordon, Ivan
;
Bearda, Twan
;
Poortmans, Jef
Journal
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1947
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1947
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations