Publication:
GIDL behavior of p- and n-MuGFET devices with different TiN metal gate thickness and high-k gate dielectrics
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1886 since deposited on 2021-10-20
2last month
Acq. date: 2025-12-09
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Views
1886 since deposited on 2021-10-20
2last month
Acq. date: 2025-12-09
Citations