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Sub-5-nm-spatial resolution in scanning spreading resistance microscopy using full-diamond tips
Publication:
Sub-5-nm-spatial resolution in scanning spreading resistance microscopy using full-diamond tips
Date
2003
Journal article
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7206.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Alvarez, D.
;
Hartwich, J.
;
Fouchier, Marc
;
Eyben, Pierre
;
Vandervorst, Wilfried
Journal
Applied Physics Letters
Abstract
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1930
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations
Metrics
Views
1930
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations