Publication:

Irradiation induced lattice defects in Si1-xGex devices and their effect on device performance

Date

1995
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorTakami, Y.
dc.contributor.authorHayama, Kiyoteru
dc.contributor.authorSunaga, H.
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.contributor.authorClauws, P.
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-09-29T13:13:08Z
dc.date.available2021-09-29T13:13:08Z
dc.date.embargo9999-12-31
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/797
dc.source.beginpage429
dc.source.endpage435
dc.source.issue4
dc.source.journalMaterials Science and Technology
dc.source.volume11
dc.title

Irradiation induced lattice defects in Si1-xGex devices and their effect on device performance

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
771.pdf
Size:
662.27 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles