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Electrical characterization, modelling and simulation of MOS structures with high-k gate stacks
Publication:
Electrical characterization, modelling and simulation of MOS structures with high-k gate stacks
Date
2003
Book Chapter
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Autran, J.L.
;
Munteanu, D.
;
Houssa, Michel
Journal
Abstract
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1948
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1948
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations