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Low-Frequency Noise Characterization of High Energy Electron and Gamma-Irradiated Si Junction Diodes
Publication:
Low-Frequency Noise Characterization of High Energy Electron and Gamma-Irradiated Si Junction Diodes
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Date
1995
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, C.
;
Dubuc, Jean-Paul
;
Simoen, Eddy
Journal
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1988
since deposited on 2021-09-29
1
last month
Acq. date: 2026-01-10
Citations
Metrics
Views
1988
since deposited on 2021-09-29
1
last month
Acq. date: 2026-01-10
Citations