Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Presentations
Low-Frequency Noise Characterization of High Energy Electron and Gamma-Irradiated Si Junction Diodes
Publication:
Low-Frequency Noise Characterization of High Energy Electron and Gamma-Irradiated Si Junction Diodes
Date
1995
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, C.
;
Dubuc, Jean-Paul
;
Simoen, Eddy
Journal
Abstract
Description
Metrics
Views
1987
since deposited on 2021-09-29
Acq. date: 2025-10-25
Citations
Metrics
Views
1987
since deposited on 2021-09-29
Acq. date: 2025-10-25
Citations