Publication:

Monte Carlo Analysis of p-Type Si0.75Ge0.25-Channel Nanosheet Performance

Date

2022
Journal article
https://doi.org/10.1109/TED.2022.3204934
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dc.contributor.authorBufler, Fabian
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorFavia, Paola
dc.contributor.authorEneman, Geert
dc.contributor.authorMatagne, Philippe
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorHellings, Geert
dc.contributor.imecauthorBufler, Fabian
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorHellings, Geert
dc.contributor.orcidimecBufler, Fabian::0000-0002-1558-9378
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.date.accessioned2022-11-15T10:53:45Z
dc.date.available2022-10-03T02:50:20Z
dc.date.available2022-11-15T10:53:45Z
dc.date.embargo2022-09-19
dc.date.issued2022
dc.identifier.doi10.1109/TED.2022.3204934
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40530
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage6384
dc.source.endpage6387
dc.source.issue11
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages4
dc.source.volume69
dc.title

Monte Carlo Analysis of p-Type Si0.75Ge0.25-Channel Nanosheet Performance

dc.typeJournal article
dspace.entity.typePublication
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