Publication:

Superior NBTI in high-k SiGe transistors - Part I: experimental

Date

2017

Journal article

Simple item page Full metadata Statistics

Files

34278.pdf 1.45 MB

Author(s)

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Witters, Liesbeth

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Horiguchi, Naoto

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Journal

IEEE Transactions on Electron Devices

Metrics

1903 since deposited on 2021-10-24

2last month

Acq. date: 2025-12-12