Publication:

Characterization of time-dependent variability using 32k transistor arrays in advanced HK/MG technology

Date

2015
Proceedings Paper
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dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorChen, Chris
dc.contributor.authorFranco, Jacopo
dc.contributor.authorBury, Erik
dc.contributor.authorChanda, Kaushik
dc.contributor.authorWatt, J.
dc.contributor.authorRoussel, Philippe
dc.contributor.authorCatthoor, Francky
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorChen, Chris
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-23T00:56:26Z
dc.date.available2021-10-23T00:56:26Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26168
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112702
dc.source.beginpage3B.1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate19/04/2015
dc.source.conferencelocationMonterey, CA USA
dc.title

Characterization of time-dependent variability using 32k transistor arrays in advanced HK/MG technology

dc.typeProceedings paper
dspace.entity.typePublication
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