Publication:
Pulsed stress reliability investigations of Schottky diodes and HBTs
Date
| dc.contributor.author | Schuessler, M. | |
| dc.contributor.author | Krozer, V. | |
| dc.contributor.author | Bock, Karlheinz | |
| dc.contributor.author | Hartnagel, H. L. | |
| dc.date.accessioned | 2021-09-29T15:23:35Z | |
| dc.date.available | 2021-09-29T15:23:35Z | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1469 | |
| dc.source.beginpage | 1907 | |
| dc.source.endpage | 1910 | |
| dc.source.journal | Microelectronics and Reliability | |
| dc.source.volume | 36 | |
| dc.title | Pulsed stress reliability investigations of Schottky diodes and HBTs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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