Publication:

Compact Modeling and Design Exploration of Non-Destructive Read-Out 1T1C FeRAM

Date

2024
Journal article
https://doi.org/10.1109/TED.2024.3418304
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dc.contributor.authorXiang, Yang
dc.contributor.authorMukherjee, Shankha
dc.contributor.authorHellings, Geert
dc.contributor.authorOh, Hyungrock
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorXiang, Yang
dc.contributor.imecauthorMukherjee, Shankha
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorOh, Hyungrock
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.orcidimecXiang, Yang::0000-0003-0091-6935
dc.contributor.orcidimecMukherjee, Shankha::0000-0001-5832-8170
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecOh, Hyungrock::0000-0001-5244-5755
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.contributor.orcidimecGarcia Bardon, Marie::0000-0001-5772-5406
dc.date.accessioned2024-09-24T08:14:12Z
dc.date.available2024-07-19T18:44:18Z
dc.date.available2024-09-24T08:14:12Z
dc.date.issued2024
dc.description.wosFundingTextThis work was supported by Imec's Industrial Affiliation Program (IIAP).
dc.identifier.doi10.1109/TED.2024.3418304
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44180
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage4685
dc.source.endpage4691
dc.source.issue8
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages7
dc.source.volume71
dc.title

Compact Modeling and Design Exploration of Non-Destructive Read-Out 1T1C FeRAM

dc.typeJournal article
dspace.entity.typePublication
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