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Electrical characterization of p-GeSn/n-Ge diodes with interface traps under dc and ac regimes
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Electrical characterization of p-GeSn/n-Ge diodes with interface traps under dc and ac regimes
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baert, Bruno
;
Gupta, Somya
;
Gencarelli, Federica
;
Loo, Roger
;
Simoen, Eddy
;
Nguyen, Duy
Journal
Solid-State Electronics
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1907
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Acq. date: 2026-01-06
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Views
1907
since deposited on 2021-10-22
5
last month
1
last week
Acq. date: 2026-01-06
Citations