Publication:

Mapping of CMOS FET degradation in bias space - application to DRAM peripheral devices

Date

2016
Proceedings Paper
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dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorSchram, Tom
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorGrasser, Tibor
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.accessioned2021-10-23T11:36:50Z
dc.date.available2021-10-23T11:36:50Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26796
dc.identifier.urlhttp://wodim2016.imm.cnr.it/
dc.source.conference16th Workshop on Dielectrics in Microelectronics - WoDiM
dc.source.conferencedate27/06/2016
dc.source.conferencelocationCatania Italy
dc.title

Mapping of CMOS FET degradation in bias space - application to DRAM peripheral devices

dc.typeProceedings paper
dspace.entity.typePublication
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