Publication:

RF performance degradation due to coupling of digital switching noise in lightly doped substrates

Date

2003
Proceedings Paper
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dc.contributor.authorSoens, Charlotte
dc.contributor.authorCrunelle, Cathy
dc.contributor.authorWambacq, Piet
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorLinten, Dimitri
dc.contributor.authorDonnay, Stephane
dc.contributor.authorRolain, Y.
dc.contributor.authorKuijk, Maarten
dc.contributor.authorBarel, A.
dc.contributor.imecauthorSoens, Charlotte
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.date.accessioned2021-10-15T06:44:33Z
dc.date.available2021-10-15T06:44:33Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8160
dc.source.beginpage127
dc.source.conferenceSouthwest Symposium on Mixed-Signal Design
dc.source.conferencedate23/02/2003
dc.source.conferencelocationLas Vegas, NV USA
dc.source.endpage132
dc.title

RF performance degradation due to coupling of digital switching noise in lightly doped substrates

dc.typeProceedings paper
dspace.entity.typePublication
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