Publication:

Application of machine learning modeling for predicting the reliability of solder joints under thermal cycling

 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-1867-827X
cris.virtual.orcid0000-0002-6753-6438
cris.virtualsource.department8aa0c758-c770-49d7-bfd4-e80498e6e40b
cris.virtualsource.department0aefe159-9129-4bab-908e-3a73693ee2e4
cris.virtualsource.orcid8aa0c758-c770-49d7-bfd4-e80498e6e40b
cris.virtualsource.orcid0aefe159-9129-4bab-908e-3a73693ee2e4
dc.contributor.authorYu, Qiulin
dc.contributor.authorNawghane, Chinmay
dc.contributor.authorZhang, Zihan
dc.contributor.authorVandevelde, Bart
dc.contributor.authorFendt, Karl
dc.contributor.authorKrivec, Thomas
dc.contributor.authorGruber, Dieter P.
dc.date.accessioned2026-06-01T15:14:42Z
dc.date.available2026-06-01T15:14:42Z
dc.date.createdwos2025-09-16
dc.date.issued2025
dc.description.abstractIn this study, Machine Learning (ML) methods combined with Optuna hyperparameter optimization were investigated to predict creep strain in solder joints of multilayer chip capacitors. Material properties, geometry and thermal loading conditions were varied in simulations using Finite Element Modeling. Evaluated ML models included Random Forest, Gradient Boosting, Support Vector Regression (SVR) and Artificial Neural Network (ANN). The results demonstrated a prediction accuracy of 96%, particularly for SVR and ANN. The model performance significantly improved with increasing data size up to around 600 simulations. In the feature and hyperparameter importance analysis, solder stand-off height and component length most influenced ANN predictions, with learning rate being the key hyperparameter, while for SVR, the regularization parameter or kernel function was most critical.
dc.description.wosFundingTextFunded by the European Union (Grant Agreement No. 101072491) . Views and opinions expressed are however those of the author (s) only and do not necessarily reflect those of the European Union or the European Research Executive Agency. Neither the European Union nor the granting authority can be held responsible for them.
dc.identifier.doi10.1016/j.microrel.2025.115900
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59510
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.beginpage115900
dc.source.journalMICROELECTRONICS RELIABILITY
dc.source.numberofpages11
dc.source.volume174
dc.subject.keywordsARTIFICIAL NEURAL-NETWORK
dc.subject.keywordsFATIGUE
dc.subject.keywordsINITIATION
dc.subject.keywordsSNAGCU
dc.subject.keywordsSTRAIN
dc.title

Application of machine learning modeling for predicting the reliability of solder joints under thermal cycling

dc.typeJournal article
dspace.entity.typePublication
imec.internal.crawledAt2025-10-22
imec.internal.sourcecrawler
Files

Original bundle

Name:
1-s2.0-S2666831926000263-main.pdf
Size:
3.93 MB
Format:
Adobe Portable Document Format
Description:
Published
Publication available in collections: