Publication:
Application of machine learning modeling for predicting the reliability of solder joints under thermal cycling
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-1867-827X | |
| cris.virtual.orcid | 0000-0002-6753-6438 | |
| cris.virtualsource.department | 8aa0c758-c770-49d7-bfd4-e80498e6e40b | |
| cris.virtualsource.department | 0aefe159-9129-4bab-908e-3a73693ee2e4 | |
| cris.virtualsource.orcid | 8aa0c758-c770-49d7-bfd4-e80498e6e40b | |
| cris.virtualsource.orcid | 0aefe159-9129-4bab-908e-3a73693ee2e4 | |
| dc.contributor.author | Yu, Qiulin | |
| dc.contributor.author | Nawghane, Chinmay | |
| dc.contributor.author | Zhang, Zihan | |
| dc.contributor.author | Vandevelde, Bart | |
| dc.contributor.author | Fendt, Karl | |
| dc.contributor.author | Krivec, Thomas | |
| dc.contributor.author | Gruber, Dieter P. | |
| dc.date.accessioned | 2026-06-01T15:14:42Z | |
| dc.date.available | 2026-06-01T15:14:42Z | |
| dc.date.createdwos | 2025-09-16 | |
| dc.date.issued | 2025 | |
| dc.description.abstract | In this study, Machine Learning (ML) methods combined with Optuna hyperparameter optimization were investigated to predict creep strain in solder joints of multilayer chip capacitors. Material properties, geometry and thermal loading conditions were varied in simulations using Finite Element Modeling. Evaluated ML models included Random Forest, Gradient Boosting, Support Vector Regression (SVR) and Artificial Neural Network (ANN). The results demonstrated a prediction accuracy of 96%, particularly for SVR and ANN. The model performance significantly improved with increasing data size up to around 600 simulations. In the feature and hyperparameter importance analysis, solder stand-off height and component length most influenced ANN predictions, with learning rate being the key hyperparameter, while for SVR, the regularization parameter or kernel function was most critical. | |
| dc.description.wosFundingText | Funded by the European Union (Grant Agreement No. 101072491) . Views and opinions expressed are however those of the author (s) only and do not necessarily reflect those of the European Union or the European Research Executive Agency. Neither the European Union nor the granting authority can be held responsible for them. | |
| dc.identifier.doi | 10.1016/j.microrel.2025.115900 | |
| dc.identifier.issn | 0026-2714 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/59510 | |
| dc.language.iso | eng | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | |
| dc.source.beginpage | 115900 | |
| dc.source.journal | MICROELECTRONICS RELIABILITY | |
| dc.source.numberofpages | 11 | |
| dc.source.volume | 174 | |
| dc.subject.keywords | ARTIFICIAL NEURAL-NETWORK | |
| dc.subject.keywords | FATIGUE | |
| dc.subject.keywords | INITIATION | |
| dc.subject.keywords | SNAGCU | |
| dc.subject.keywords | STRAIN | |
| dc.title | Application of machine learning modeling for predicting the reliability of solder joints under thermal cycling | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2025-10-22 | |
| imec.internal.source | crawler | |
| Files | Original bundle
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