Publication:
Exploring Micro-architectural Side-Channel Leakages through Statistical Testing
Date
| dc.contributor.author | Bhattacharya, Sarani | |
| dc.contributor.author | Verbauwhede, Ingrid | |
| dc.date.accessioned | 2022-08-25T15:05:49Z | |
| dc.date.available | 2022-07-18T02:27:52Z | |
| dc.date.available | 2022-08-25T15:05:49Z | |
| dc.date.issued | 2021 | |
| dc.identifier.eisbn | 978-3-9819263-5-4 | |
| dc.identifier.issn | na | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40135 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 633 | |
| dc.source.conference | Design, Automation and Test in Europe Conference and Exhibition (DATE) | |
| dc.source.conferencedate | FEB 01-05, 2021 | |
| dc.source.conferencelocation | Virtual | |
| dc.source.endpage | 636 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 4 | |
| dc.title | Exploring Micro-architectural Side-Channel Leakages through Statistical Testing | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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