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A 65-nm node SRAM solution using alt-PSM with ArF lithography

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dc.contributor.authorDriessen, Frank
dc.contributor.authorZawadzki, Mary T.
dc.contributor.authorKrishnan, Prakash R.
dc.contributor.authorBalasinski, Artur
dc.contributor.authorVandenberghe, Geert
dc.contributor.imecauthorVandenberghe, Geert
dc.date.accessioned2021-10-15T13:17:14Z
dc.date.available2021-10-15T13:17:14Z
dc.date.issued2004-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8862
dc.source.beginpage224
dc.source.conferenceDesign and Process Integration for Microelectronic Manufacturing II
dc.source.conferencedate22/02/2004
dc.source.conferencelocationSanta Clara, CA USA
dc.source.endpage234
dc.title

A 65-nm node SRAM solution using alt-PSM with ArF lithography

dc.typeProceedings paper
dspace.entity.typePublication
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