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Photoelectrochemical etching inducing n-type Ge (100) pyramid texturization probed by integrated electrochemical chamber/X-ray photoelectron spectroscopy

Date

2019
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dc.contributor.authorAbrenica, Graniel
dc.contributor.authorLebedev, Mikhail
dc.contributor.authorLe, Hy
dc.contributor.authorHajduk, Andreas
dc.contributor.authorFingerle, Mathias
dc.contributor.authorMayer, Thomas
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorvan Dorp, Dennis
dc.contributor.imecauthorAbrenica, Graniel
dc.contributor.imecauthorLe, Hy
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorvan Dorp, Dennis
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.contributor.orcidimecvan Dorp, Dennis::0000-0002-1085-4232
dc.date.accessioned2021-10-27T07:25:00Z
dc.date.available2021-10-27T07:25:00Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32400
dc.identifier.urlhttp://ma.ecsdl.org/content/MA2019-01/45/2221.abstract
dc.source.beginpage2221
dc.source.conferenceElectrochemical Society (ECS) Spring Meeting: General Student Poster Session
dc.source.conferencedate26/05/2019
dc.source.conferencelocationDallas, TX USA
dc.title

Photoelectrochemical etching inducing n-type Ge (100) pyramid texturization probed by integrated electrochemical chamber/X-ray photoelectron spectroscopy

dc.typeMeeting abstract
dspace.entity.typePublication
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