Publication:
Formation of continuous and ultra-thin PtSi layers for infrared detector applications
Date
| dc.contributor.author | Donaton, R. A. | |
| dc.contributor.author | Jin, S. | |
| dc.contributor.author | Bender, Hugo | |
| dc.contributor.author | Maex, Karen | |
| dc.contributor.author | Vantomme, Andre | |
| dc.contributor.author | Langouche, G. | |
| dc.contributor.imecauthor | Bender, Hugo | |
| dc.contributor.imecauthor | Maex, Karen | |
| dc.contributor.imecauthor | Vantomme, Andre | |
| dc.date.accessioned | 2021-09-30T11:53:51Z | |
| dc.date.available | 2021-09-30T11:53:51Z | |
| dc.date.issued | 1998 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2557 | |
| dc.source.conference | Workshop on Nanoscale Characterization of Silicide/Semiconductor Contacts by Scanning Probe Microscopy; 24 Sept. 1998; Gent, Bel | |
| dc.source.conferencelocation | ||
| dc.title | Formation of continuous and ultra-thin PtSi layers for infrared detector applications | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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