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Multiscale modeling of the electrostatic impact of self-assembled monolayers used as gate dielectric treatment in organic thin-film transistors
Publication:
Multiscale modeling of the electrostatic impact of self-assembled monolayers used as gate dielectric treatment in organic thin-film transistors
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Date
2014
Journal article
https://doi.org/10.1021/am503873f
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mityashin, Alexander
;
Roscioni, Otello Maria
;
Muccioli, Luca
;
Zannoni, Claudio
;
Geskin, Victor
;
Cornil, Jérôme
;
Janssen, Dimitri
;
Steudel, Soeren
;
Genoe, Jan
;
Heremans, Paul
Journal
ACS Applied Materials & Interfaces
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1997
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations
Metrics
Views
1997
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations