Publication:
Innovating SRAM design for fast process related defect recognition and failure analysis
Date
| dc.contributor.author | Coppens, P. | |
| dc.contributor.author | Vanhorebeek, Guido | |
| dc.contributor.author | De Backer, E. | |
| dc.contributor.author | Yuan, Xiao Jie | |
| dc.date.accessioned | 2021-10-06T10:50:15Z | |
| dc.date.available | 2021-10-06T10:50:15Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3316 | |
| dc.source.beginpage | 220 | |
| dc.source.conference | ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference | |
| dc.source.conferencedate | 13/09/1999 | |
| dc.source.conferencelocation | Leuven Belgium | |
| dc.source.endpage | 223 | |
| dc.title | Innovating SRAM design for fast process related defect recognition and failure analysis | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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