Publication:
Diamond Probes Technology
Date
| dc.contributor.author | Hantschel, Thomas | |
| dc.contributor.author | Conard, Thierry | |
| dc.contributor.author | Kilpatrick, Jason | |
| dc.contributor.author | Cross, Graham | |
| dc.contributor.imecauthor | Hantschel, Thomas | |
| dc.contributor.imecauthor | Conard, Thierry | |
| dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
| dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
| dc.date.accessioned | 2021-10-27T10:02:13Z | |
| dc.date.available | 2021-10-27T10:02:13Z | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33093 | |
| dc.identifier.url | https://www.springer.com/gp/book/9783030156114#aboutAuthors | |
| dc.source.beginpage | 351 | |
| dc.source.book | Electrical Atomic Force Microscopy for Nanoelectronics | |
| dc.source.endpage | 381 | |
| dc.title | Diamond Probes Technology | |
| dc.type | Book chapter | |
| dspace.entity.type | Publication | |
| Files | ||
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