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Improving Time-Dependent Gate Breakdown of GaN HEMTs with p-type Gate
Publication:
Improving Time-Dependent Gate Breakdown of GaN HEMTs with p-type Gate
Date
2021
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tallarico, Andrea
;
Posthuma, Niels
;
Bakeroot, Benoit
;
Decoutere, Stefaan
;
Fiegna, C
;
Sangiorgi, E
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1935
since deposited on 2021-10-31
400
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1935
since deposited on 2021-10-31
400
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations