Publication:

Substrate current and kink analysis of MOSFETs at liquid helium temperatures

Date

2000
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMohammadzadeh, A.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-14T13:47:11Z
dc.date.available2021-10-14T13:47:11Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4748
dc.source.beginpage265
dc.source.conference4th European Workshop on Low Temperature Electronics - WOLTE-4
dc.source.conferencedate21/06/2000
dc.source.conferencelocationNoordwijk The Netherlands
dc.source.endpage270
dc.title

Substrate current and kink analysis of MOSFETs at liquid helium temperatures

dc.typeProceedings paper
dspace.entity.typePublication
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