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A novel hot-hole injection degradation model for lateral nDMOS transistors
Publication:
A novel hot-hole injection degradation model for lateral nDMOS transistors
Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Moens, P.
;
Tack, Marnix
;
Degraeve, Robin
;
Groeseneken, Guido
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Abstract
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1943
since deposited on 2021-10-14
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1
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Acq. date: 2025-12-08
Citations
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Views
1943
since deposited on 2021-10-14
4
last month
1
last week
Acq. date: 2025-12-08
Citations