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Challenges in scaling of CMOS devices towards 65nm node
Publication:
Challenges in scaling of CMOS devices towards 65nm node
Date
2003-06
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jurczak, Gosia
;
Veloso, Anabela
;
Rooyackers, Rita
;
Augendre, Emmanuel
;
Mertens, Sofie
;
Rothschild, Aude
;
Schaekers, Marc
;
Lindsay, Richard
;
Lauwers, Anne
;
Henson, Kirklen
;
Severi, Simone
;
Pollentier, Ivan
;
De Keersgieter, An
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1915
since deposited on 2021-10-15
Acq. date: 2025-10-22
Citations
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Views
1915
since deposited on 2021-10-15
Acq. date: 2025-10-22
Citations