Publication:
Impact of channel engineering technology on HC performance of 100 nm MOSFETs
Date
| dc.contributor.author | Okhonin, S. | |
| dc.contributor.author | Fazan, P. | |
| dc.contributor.author | Kubicek, Stefan | |
| dc.contributor.author | Henson, Kirklen | |
| dc.contributor.author | De Meyer, Kristin | |
| dc.contributor.author | Ponomarev, Youri | |
| dc.contributor.imecauthor | Kubicek, Stefan | |
| dc.contributor.imecauthor | De Meyer, Kristin | |
| dc.date.accessioned | 2021-10-14T17:29:50Z | |
| dc.date.available | 2021-10-14T17:29:50Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5537 | |
| dc.source.beginpage | 283 | |
| dc.source.conference | Proceedings of the 31st European Solid-State Device Research Conference | |
| dc.source.conferencedate | 11/09/2001 | |
| dc.source.conferencelocation | Nuremberg Germany | |
| dc.source.endpage | 286 | |
| dc.title | Impact of channel engineering technology on HC performance of 100 nm MOSFETs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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