Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method
Publication:
Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method
Date
2004
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
DeGroot, D.C.
;
Rolain, Y.
;
Pintelon, R.
;
Schoukens, J.
Journal
Abstract
Description
Metrics
Views
1935
since deposited on 2021-10-15
418
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1935
since deposited on 2021-10-15
418
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations