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Conference contributions
Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method
Publication:
Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
DeGroot, D.C.
;
Rolain, Y.
;
Pintelon, R.
;
Schoukens, J.
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1936
since deposited on 2021-10-15
Acq. date: 2025-12-09
Citations
Metrics
Views
1936
since deposited on 2021-10-15
Acq. date: 2025-12-09
Citations