Publication:
Design, test generation, processing, and pre- and post-bond measurement results of a 3D-DfT demonstrator chip stack
Date
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | De Wachter, Bart | |
| dc.contributor.author | O'Loughlin, Stephen | |
| dc.contributor.author | Deutsch, Sergej | |
| dc.contributor.author | Papameletis, Christos | |
| dc.contributor.author | Burgherr, Tobias | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | De Wachter, Bart | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-22T03:29:12Z | |
| dc.date.available | 2021-10-22T03:29:12Z | |
| dc.date.issued | 2014-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24202 | |
| dc.source.conference | CDN Live! EMEA | |
| dc.source.conferencedate | 19/05/2014 | |
| dc.source.conferencelocation | München Germany | |
| dc.title | Design, test generation, processing, and pre- and post-bond measurement results of a 3D-DfT demonstrator chip stack | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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