Publication:

Analysis of then substrate current in Ge pMOSFETs

Date

2009
Meeting abstract
Simple item page Full metadata Statistics
 
dc.contributor.authorTodi, V.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorEneman, Geert
dc.contributor.authorClaeys, Cor
dc.contributor.authorSundaram, K.B.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.date.accessioned2021-10-18T03:38:54Z
dc.date.available2021-10-18T03:38:54Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16312
dc.source.beginpage2389
dc.source.conference216th ECS Meeting
dc.source.conferencedate4/10/2009
dc.source.conferencelocationVienna Austria
dc.title

Analysis of then substrate current in Ge pMOSFETs

dc.typeMeeting abstract
dspace.entity.typePublication
Files

Original bundle

Name:
19372.pdf
Size:
86.03 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions