Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Process-improved RRAM cell performance and reliability and paving the way for manufacturability and scalability for high density memory application
Publication:
Process-improved RRAM cell performance and reliability and paving the way for manufacturability and scalability for high density memory application
Copy permalink
Date
2012
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
24436.pdf
624.85 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kar, Gouri Sankar
;
Fantini, Andrea
;
Chen, Yangyin
;
Paraschiv, Vasile
;
Govoreanu, Bogdan
;
Hody, Hubert
;
Jossart, Nico
;
Tielens, Hilde
;
Brus, Stephan
;
Richard, Olivier
;
Vandeweyer, Tom
;
Wouters, Dirk
;
Altimime, Laith
;
Jurczak, Gosia
Journal
Abstract
Description
Metrics
Views
1932
since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations
Metrics
Views
1932
since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations