Publication:

Maximizing reliable performance of CMOS applications–A comprehensive study of FPGA pass gates

Date

2014
Proceedings Paper
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dc.contributor.authorKaczer, Ben
dc.contributor.authorChen, Chris
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRoussel, Philippe
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorFranco, Jacopo
dc.contributor.authorCho, Moon Ju
dc.contributor.authorWatt, Jeff
dc.contributor.authorChanda, Kaushik
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorGrasser, Tibor
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorChen, Chris
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-22T02:24:59Z
dc.date.available2021-10-22T02:24:59Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24021
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6860596&contentType=Conference+Publications
dc.source.beginpage2D.4
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.title

Maximizing reliable performance of CMOS applications–A comprehensive study of FPGA pass gates

dc.typeProceedings paper
dspace.entity.typePublication
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