Publication:

On the reverse short channel effect in deep submicron heterojunction MOSFET's and its impact on the current-voltage behavior

Date

2000
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorCollaert, Nadine
dc.contributor.authorVerheyen, Peter
dc.contributor.authorDe Meyer, Kristin
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-14T12:44:44Z
dc.date.available2021-10-14T12:44:44Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4204
dc.source.beginpage1214
dc.source.issue6
dc.source.journalIEEE Trans. Electron Devices
dc.source.volume47
dc.title

On the reverse short channel effect in deep submicron heterojunction MOSFET's and its impact on the current-voltage behavior

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles