Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Electrical quality assessment of epitaxial wafers based on p-n junction diagnostics
Publication:
Electrical quality assessment of epitaxial wafers based on p-n junction diagnostics
Copy permalink
Date
1999
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, C.
;
Simoen, Eddy
;
Poyai, Amporn
;
Czerwinski, A.
Journal
J. Electrochem. Soc.
Abstract
Description
Metrics
Views
1936
since deposited on 2021-10-06
Acq. date: 2026-01-07
Citations
Metrics
Views
1936
since deposited on 2021-10-06
Acq. date: 2026-01-07
Citations