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Electrical quality assessment of epitaxial wafers based on p-n junction diagnostics
Publication:
Electrical quality assessment of epitaxial wafers based on p-n junction diagnostics
Date
1999
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, C.
;
Simoen, Eddy
;
Poyai, Amporn
;
Czerwinski, A.
Journal
J. Electrochem. Soc.
Abstract
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1934
since deposited on 2021-10-06
436
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1934
since deposited on 2021-10-06
436
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations